Bayesian analysis of hazard rate, change point, and cost-optimal burn-in time for electronic devices

IEEE Transactions on Reliability

Volumn 59, Issue 1, 2010, Pages 132-138

  Yuan, Tao ^a   Kuo, Yue ^b  

^a US Institute of Navigation   (United States)

^b TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Bayesian analysis; Change point; Optimal burn in; Time dependent dielectric breakdown; Weibull exponential distribution

Indexed keywords

BAYESIAN ANALYSIS; CHANGE-POINTS; EXPONENTIAL DISTRIBUTIONS; OPTIMAL BURN-IN TIME; WEIBULL;

BAYESIAN NETWORKS; DIELECTRIC DEVICES; DIELECTRIC FILMS; ELECTRIC BREAKDOWN; EXPONENTIAL FUNCTIONS; GATE DIELECTRICS; GATES (TRANSISTOR); OPTIMIZATION; THERMOELECTRIC EQUIPMENT; WEIBULL DISTRIBUTION;

COST BENEFIT ANALYSIS;

EID: 77949273838     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2010.2040776     Document Type: Article

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