Strategy for planning accelerated life tests with small sample sizes

IEEE Transactions on Reliability

Volumn 59, Issue 4, 2010, Pages 610-619

  Ma, Haiming ^a   Meeker, William Q ^a  

^a Iowa State University   (United States)

Author keywords

Accelerated life testing; large sample approximate variance; maximum likelihood; stress testing

Indexed keywords

ACCELERATED LIFE TESTING; ACCELERATED LIFE TESTS; APPROXIMATE VARIANCE; COMPROMISE TEST PLAN; FAILURE-TIME DISTRIBUTION; SIMULATION METHODS; SMALL SAMPLE SIZE; STRESS LEVELS; STRESS TESTING; TEST CONDITION; TEST PLAN; TEST UNIT;

MAXIMUM LIKELIHOOD ESTIMATION; PROBABILITY;

TESTING;

EID: 78649797650     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2010.2083251     Document Type: Article

References (14)

1. L. A. Escobar and W. Q. Meeker, "Planning accelerated life tests with two or more experimental factors," Technometrics, Vol. 37, pp. 411-422, 1995.
2. L. A. Escobar and W. Q. Meeker, "The large-sample approximate equivalence of the fisher information matrices for type I and type II censored data from location-scale families," Communication of Statistics-Theory: Theory and Methods, Vol. 30, pp. 2211-2225, 2001.
3. L. A. Escobar and W. Q. Meeker, "A review of accelerated test models," Statistical Science, Vol. 21, pp. 552-577, 2006.
4. S. L. Jeng and W. Q. Meeker, "Comparison of approximate confidence interval procedures for type I censored data," Technometrics, Vol. 42, pp. 135-148, 2000.
5. W. Q. Meeker, "A comparison of accelerated life test plans for Weibull and lognormal distributions and type I censoring," Technometrics, Vol. 26, pp. 157-172, 1984.
6. W. Q. Meeker and W. Nelson, "Optimized accelerated life tests for Weibull and extreme value distributions," IEEE Trans. Reliability, Vol. 24, pp. 321-322, 1975.
7. W. Q. Meeker and G. J. Hahn, How To Plan An Accelerated Life Test-Some Practical Guidelines. Milwaukee, Wisconsin: American Society for Quality Control, 1985, Volume 10 in the American Society for Quality Control Basic References in Quality Control: Statistical Techniques.
8. W. Q. Meeker and M. J. LuValle, "An accelerated life test model based on reliability kinetics," Technometrics, Vol. 37, pp. 133-145, 1995.
9. W. Q. Meeker and L. A. Escobar, Statistical Methods for Reliability Data. New York: Wiley, 1998.
10. W. Q. Meeker, L. A. Escobar, and S. A. Zayac, "Use of sensitivity analysis to assess the effect of model uncertainty in analyzing accelerated life test data," in Case Studies in Reliability and Maintenance, W. R. Blischke and D. N. P. Murthy, Eds. New York: Wiley, 2003, ch. 6.
11. W. Nelson, Accelerated Testing-Statistical Models, Test Plans and Data Analysis. New York: Wiley, 1990.
12. W. Nelson and T. J. Kielpinski, "Theory for optimized censored accelerated tests for normal and lognormal life distributions," Technometrics, Vol. 18, pp. 105-114, 1976.
13. W. Nelson and W. Q. Meeker, "Theory for optimized censored accelerated life tests for Weibull and extreme value distributions," Technometrics, Vol. 20, pp. 171-177, 1978.
14. S. A. Vander Wieland W. Q. Meeker, "Accuracy of approximate confidence bounds using censored Weibull regression data from accelerated life tests," IEEE Trans. Reliability, Vol. 39, no. 3, pp. 346-351, Aug. 1990.