Equivalent accelerated life testing plans and application to reliability prediction

SAE International Journal of Materials and Manufacturing

Volumn 3, Issue 1, 2010, Pages 71-77

  Liao, Haitao ^a   Elsayed, E A ^b  

^a University of Tennessee   (United States)

^b DEPARTMENT OF INDUSTRIAL AND SYSTEMS ENGINEERING   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATED LIFE TESTING; CONSTANT STRESS; FAILURE-TIME DISTRIBUTION; NORMAL OPERATING CONDITIONS; RELIABILITY PREDICTION; STEP-STRESS; STRESS LOADING;

ELECTRON EMISSION; LOADING; TESTING;

STRESS ANALYSIS;

EID: 78649893404     PISSN: 19463979     EISSN: 19463987     Source Type: Journal    
DOI: 10.4271/2010-01-0201     Document Type: Article

References (20)

1. Bai D.S., Kim M.S., and Lee S.H., "Optimum Simple Step-stress Accelerated Life Tests with Censoring," IEEE Trans. on Reliability, vol. 38, pp. 528-532, 1989.
2. Bai D.S. and Chun Y.R., "Optimum Simple Step-stress Accelerated Life Tests with Competing Causes of Failure," IEEE Trans. on Reliability, vol. 40, pp. 622-627, 1991.
3. Chernoff H., "Optimal Accelerated Life Designs for Estimation," Technometrics, vol. 4, pp. 381-408, 1962.
4. Chung S.W. and Bai D.S., "Optimal Designs of Simple Step-stress Accelerated Life Tests for Lognormal Lifetime Distributions," International Journal of Reliability, Quality and Safety Engineering 5, 315-336, 1998.
5. Elsayed E.A., Reliability Engineering, Addison Wesley, NY, 1996.
6. Khamis I.H. and Higgins J.J., "Optimum 3-step Step- stress Tests," IEEE Trans. on Reliability, vol. 45, pp. 341-345, 1996.
7. Meeker W.Q. and Escobar L. A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., NY, 1998.
8. Meeker W.Q. and Hahn G.J., "Asymptotically Optimum Over-stress tests to Estimate the Survival Probability at a Condition with a Low Expected Failure Probability," Technometrics, vol. 19, pp. 381-399, 1977.
9. Meeker W.Q., "A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring," Technometrics, vol. 26, pp. 157-171, 1984.
10. Meeter C.A. and Meeker W.Q., "Optimum Accelerated Life Tests with a Nonconstant Sigma," Technometrics, vol. 36, pp. 71-83, 1994.
11. Meyer G.H., "On Solving Nonlinear Equations with a One-parameter Operator Imbedding," SIAM Journal on Numerical Analysis, vol. 5, pp. 739-752, 1968.
12. Miller R. and Nelson W.B., "Optimum Simple Step- stress Plans for Accelerated Life Testing," IEEE Trans. on Reliability, vol. 32, pp. 59-65, 1983.
13. Nelson W.B. and Kielpinski T.J., "Theory for Optimum Accelerated Life Tests for Normal and Lognormal Life Distributions," Technometrics, vol. 18, pp. 105-114, 1976.
14. Nelson W.B. and Meeker W.Q., "Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions," Technometrics, vol. 20, pp. 105-114, 1978.
15. Nelson W.B., Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, Wiley, NY, 1990.
16. Nelson W.B., "A Bibliography of Accelerated Test Plans," IEEE Trans. on Reliability, vol. 54, pp. 194-197, 2005.
17. Xiong C., "Inference on a Simple Step-stress Model with Type-II Censored Exponential Data," IEEE Trans. on Reliability, vol. 47, pp. 142-146, 1998.
18. Xiong C. and Milliken G.A., "Step-stress Life-testing with Random Stress-change Times for Exponential Data," IEEE Trans. on Reliability, vol. 48, pp. 141-148, 1999.
19. Xiong C. and Ji M., "Analysis of Grouped and Censored Data from Step-stress Life Testing," IEEE Trans. on Reliability, vol. 53, pp. 22-28, 2004.
20. Yang G.B., "Optimum Constant-stress Accelerated Life Test Plans," IEEE Trans. on Reliability, vol. 43, pp. 575-581, 1994.