Design of equivalent accelerated life testing plans under different stress applications

Quality Technology and Quantitative Management

Volumn 8, Issue 4, 2011, Pages 463-478

  Zhu, Yada ^a   Elsayed, Elsayed A ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b DEPARTMENT OF INDUSTRIAL AND SYSTEMS ENGINEERING   (United States)

Author keywords

Accelerated life testing (ALT); Equivalency; Maximum likelihood; Proportional hazard; Ramp test

Indexed keywords

ELECTRON EMISSION; FORECASTING; MAXIMUM LIKELIHOOD; RELIABILITY; TEST FACILITIES; YIELD STRESS; TESTING;

ACCELERATED LIFE TESTING; CONSTANT STRESS; EQUIVALENCY; NORMAL OPERATING CONDITIONS; PROPORTIONAL HAZARDS; RAMP TESTS; RELIABILITY PREDICTION; STATISTICAL PRECISION; DESIGN STRESS; FAILURE DATA; LOW STRESS; RAMP TEST; STRESS LOADING; TEST DATA; TEST PLAN; TEST TIME; TEST UNIT;

TESTING; RELIABILITY;

EID: 84857701487     PISSN: 16843703     EISSN: None     Source Type: Journal    
DOI: 10.1080/16843703.2011.11673271     Document Type: Article

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