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Volumn 139, Issue 5, 2009, Pages 1575-
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A special issue on the topic of Degradation, Damage, Fatigue and Accelerated Life Models in Reliability Testing
[No Author Info available]
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Author keywords
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Indexed keywords
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EID: 59649087863
PISSN: 03783758
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jspi.2008.05.018 Document Type: Conference Paper |
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Times cited : (2)
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References (0)
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