A deep view in cultural heritage-confocal micro X-ray spectroscopy for depth resolved elemental analysis

Applied Physics A: Materials Science and Processing

Volumn 106, Issue 2, 2012, Pages 325-338

  Kanngiesser B ^a   Malzer, W ^a   Mantouvalou, I ^a   Sokaras, D ^b,c   Karydas, A G ^b,d  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b INSTITUTE OF NUCLEAR PHYSICS   (Greece)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^d INTERNATIONAL ATOMIC ENERGY AGENCY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

2D SCANNING; ANALYTES; ANALYTICAL SIGNALS; BEAM-LINES; CHARACTERISTIC X RAYS; CONFOCAL GEOMETRY; CULTURAL HERITAGES; DEPTH PROFILE; DEPTH-RESOLVED; ELEMENTAL MAPPING; EXCITING ENERGY; EXPERIMENTAL SETUP; FIELD OF VIEWS; FOCAL REGIONS; FUTURE PERSPECTIVES; GLASSES AND CERAMICS; HETEROGENEOUS STRUCTURES; IMAGING METHOD; IN-DEPTH RESOLUTION; LAYERED MATERIAL; LIFE-SCIENCES; MATHEMATICAL FORMULATION; MATRIX COMPOSITION; MICRO-PIXE; MICRO-PROBES; MICRO-XRF; MICROMETER-SCALE; NON DESTRUCTIVE; PARTICLE INDUCED X-RAY EMISSION; PIXE TECHNIQUE; POLYCAPILLARY X-RAY LENS; PROBE ENERGY; SPATIAL RESOLUTION; SURFACE HETEROGENEITIES; X RAY FLUORESCENCE; X RAY MICROSCOPY;

CHARACTERIZATION; GEOMETRY; GLASS; PAINT; SPECTROMETERS; STRATIGRAPHY; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY SPECTROSCOPY;

THREE DIMENSIONAL;

EID: 84858859628     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-011-6698-0     Document Type: Article

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