3D Micro PIXE - A new technique for depth-resolved elemental analysis

Journal of Analytical Atomic Spectrometry

Volumn 22, Issue 10, 2007, Pages 1260-1265

  Karydas, Andreas Germanos ^a   Sokaras, Dimosthenis ^a   Zarkadas, Charalambos ^a   Grlj, Nataša ^b   Pelicon, Primož ^b   Žitnik, Matjaž ^b   Schütz, Roman ^c   Malzer, Wolfgang ^c   Kanngießer, Birgit ^c  

^a INSTITUTE OF NUCLEAR PHYSICS   (Greece)

^b JO EF STEFAN INSTITUTE   (Slovenia)

^c TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

3D MICRO-PARTICLE-INDUCED X-RAY EMISSION (PIXE); ELEMENTAL DISTRIBUTION; FOCUSED PROTON MICRO-BEAM;

CERAMIC MATERIALS; IMAGE ANALYSIS; NONDESTRUCTIVE EXAMINATION; PROTONS; THREE DIMENSIONAL COMPUTER GRAPHICS;

X RAY OPTICS;

EID: 34948824796     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/b700851c     Document Type: Article

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