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Journal of Analytical Atomic Spectrometry

Volumn 25, Issue 4, 2010, Pages 562-569

Development of laboratory confocal 3D-XRF spectrometer and nondestructive depth profiling

(2) Nakano, Kazuhiko a,b Tsuji, Kouichi a

a Osaka Prefecture University (Japan)

b JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL PERFORMANCE; BIOLOGICAL SAMPLES; DEPTH RESOLUTION; DEPTH SENSITIVITY; ENVIRONMENTAL SAMPLE; MULTI-LAYERED; NON DESTRUCTIVE; REFERENCE MATERIAL; SPIN-COATING METHOD; XRF ANALYSIS;

DEPTH PROFILING; PLASTICS; PLASTICS APPLICATIONS;

THREE DIMENSIONAL;

EID: 77950204353 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/b916974a Document Type: Article

Times cited : (36)

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