Limitations of portable XRF implementations in evaluating depth information: An archaeometric perspective

Applied Physics A: Materials Science and Processing

Volumn 89, Issue 4, 2007, Pages 857-863

  Gianoncelli, A ^a,c   Kourousias, G ^b  

^a CENTRE DE RECHERCHE ET DE RESTAURATION DES MUSÉES DE FRANCE   (France)

^b KING'S COLLEGE LONDON   (United Kingdom)

^c SINCROTRONE TRIESTE   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; INFORMATION RETRIEVAL; SURFACE TREATMENT; X RAY ANALYSIS;

ARCHAEOMETRY; ARTEFACTS; NONDESTRUCTIVE ANALYSIS TECHNIQUES; SURFACE MATERIALS;

NONDESTRUCTIVE EXAMINATION;

EID: 35348969855     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-007-4221-4     Document Type: Article

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