SCOPUS 정보 검색 플랫폼

X-Ray Spectrometry

Volumn 40, Issue 1, 2011, Pages 19-23

Analysis of thin intermediate layers by confocal μ-XRF

(4) Perez, Roberto D a,d Sánchez, Héctor J a,d Rubio, Marcelo a,c,d Perez, Carlos A b

a UNIVERSIDAD NACIONAL DE CÓRDOBA (Argentina)

b LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON (Brazil)

c Centro de Excelencia en Productos y Procesos de Cordoba (Argentina)

d Universidad Nacional de Río Cuarto Consejo Nacional de Investigaciones Científicas y Técnicas (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE SPECTROSCOPY; GLASS SUBSTRATES; ITERATIVE METHODS; LUNAR SURFACE ANALYSIS;

CONFOCAL GEOMETRY; DETECTION CHANNELS; ELEMENTAL COMPOSITIONS; EXPONENTIAL ATTENUATION; INFORMATION CONCERNING; INTERMEDIATE LAYERS; MICRO X-RAY FLUORESCENCE SPECTROSCOPY; NORMAL DIRECTION; STRATIFIED STRUCTURE; X RAY LENS;

SURFACE ANALYSIS;

EID: 79551619578 PISSN: 00498246 EISSN: 10974539 Source Type: Journal
DOI: 10.1002/xrs.1277 Document Type: Article

Times cited : (8)

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