Determination of the sequence and thicknesses of multilayers in an easel painting

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 155, Issue 4, 1999, Pages 447-451

  Brissaud, I ^a   Guillo A ^a   Lagarde, G ^a   Midy, P ^a   Calligaro, T ^b   Salomon, J ^b  

^a 91405 Orsay Campus   (France)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRON ENERGY LEVELS; ION BEAMS; MATHEMATICAL MODELS; PAINT; PIGMENTS; PROTONS; THICKNESS MEASUREMENT;

EASEL PAINTING; PAINT MULTILAYERS;

MULTILAYERS;

EID: 0033345168     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00484-X     Document Type: Article

References (7)

1. A. Guilló, DEA Arts Plastiques, Internal Report, Université Paris I Panthéon-Sorbonne, unpublished.
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3. Brissaud I., Lagarde G., Midy P. Int. J. PIXE. 7:1997;1.
4. Brissaud I., Lagarde G., Midy P. Nucl. Instr. and Meth. B. 117:1996;179.
5. G. Lagarde, I. Brissaud, P. Midy, T. Calligaro, J. Salomon, Proceedings of the Fifth International Conference on non destructive testing microanalytical methods of Works of Arts, Budapest, 1996.
6. Midy P., Lagarde G., Brissaud I., Chaumont J., Frontier J.P. Nucl. Instr. and Meth. B. 136-138:1998;551.
7. Midy P., Brissaud I. Nucl. Instr. and Meth. B. 103:1995;489.