Reconstruction of thickness and composition of stratified materials by means of 3D micro X-ray fluorescence spectroscopy

Analytical Chemistry

Volumn 80, Issue 3, 2008, Pages 819-826

  Mantouvalou, Ioanna ^a   Malzer, Wolfgang ^a   Schaumann, Ina ^b   Lühl, Lars ^a   Dargel, Rainer ^b   Vogt, Carla ^b   Kanngiesser, Birgit ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MICROMETERS; SENSITIVITY ANALYSIS; THICKNESS MEASUREMENT; THREE DIMENSIONAL;

3D MICRO X-RAY FLUORESCENCE SPECTROSCOPY (3D MICRO-XRF); ANALYTICAL TOOLS; QUANTITATIVE RECONSTRUCTION; STRATIFIED MATERIALS;

FLUORESCENCE SPECTROSCOPY;

POLYMER;

ANALYTIC METHOD; ARTICLE; CALIBRATION; IMAGE DISPLAY; IMAGE RECONSTRUCTION; MATERIALS; MEASUREMENT; QUANTITATIVE ANALYSIS; RELIABILITY; STRATIFIED MATERIAL; THICKNESS; THREE DIMENSIONAL IMAGING; VALIDATION PROCESS; X RAY FLUORESCENCE;

EID: 38849118445     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac701774d     Document Type: Article

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