Elemental depth profile of faux bamboo paint in Forbidden City studied by synchrotron radiation confocal μ-XRF

X-Ray Spectrometry

Volumn 37, Issue 6, 2008, Pages 595-598

  Wei, Xiangjun ^a   Lei, Yong ^b   Sun, Tianxi ^c   Lin, Xiaoyan ^c   Xu, Qing ^d   Chen, Dongliang ^d   Zou, Yang ^a   Jiang, Zheng ^a   Huang, Yuying ^a   Yu, Xiaohan ^a   Ding, Xunliang ^c   Xu, Hongjie ^a  

^a SHANGHAI INSTITUTE OF APPLIED PHYSICS   (China)

^b the Palace Museum   (China)

^c BEIJING NORMAL UNIVERSITY   (China)

^d INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BAMBOO; LENSES; PAINT; SYNCHROTRONS;

BEAM-LINES; ELEMENTAL DEPTH PROFILES; INCIDENT BEAMS; KB MIRRORS; MICRO-X-RAY FLUORESCENCE; POLYCAPILLARIES; SYNCHROTRON RADIATION FACILITY; THREE-DIMENSIONAL (3D) ANALYSIS; VISUAL FIELDS; X RAY FLUORESCENCE;

SYNCHROTRON RADIATION;

EID: 56749095092     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1098     Document Type: Article

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