The merits of particle induced X-ray emission in revealing painting techniques

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 189, Issue 1-4, 2002, Pages 293-302

  Neelmeijer, C ^a   Mader M ^a  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

External beam; Ion beam analysis; Non destructive: particle induced X ray emission; Painting; Pigment; Rutherford backscattering specometry

Indexed keywords

PAINTING; PIGMENTS; PROTON BEAMS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THIN FILMS;

ION BEAM ANALYSIS; PARTICLE-INDUCED X-RAY EMISSION (PIXE);

NUCLEAR INSTRUMENTATION;

EID: 0036535682     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(01)01074-6     Document Type: Conference Paper

References (17)