Concentration profiles in paint layers studied by differential PIXE

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 266, Issue 9, 2008, Pages 2047-2059

  Šmit, Ž ^a,b   Ursic M ^b   Pelicon, P ^b   Trcek Pecak T ^a   Seme B ^a   Smrekar, A ^c   Langus, I ^c   Nemec, I ^d   Kavkler, K ^d  

^a UNIVERSITY OF LJUBLJANA   (Slovenia)

^b JO EF STEFAN INSTITUTE   (Slovenia)

^c National Museum of Slovenia   (Slovenia)

^d ZVKDS Restoration Centre RS   (Slovenia)

Author keywords

81.05.Bx; 82.80.Ej; 83.80.Hj; Depth profiling; Differential PIXE; Paint layers; Pigments

Indexed keywords

ALGORITHMS; DECONVOLUTION; DEPTH PROFILING; PIGMENTS; X RAY ANALYSIS;

MATRIX INVERSION; PAINT LAYERS; PROTON NUMBERS; WEIGHT FRACTIONS;

PAINT;

EID: 43649083851     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.03.191     Document Type: Article

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