High resolution surface morphology measurements using EBSD cross-correlation techniques and afm

Microscopy and Microanalysis

Volumn 15, Issue SUPPL. 2, 2009, Pages 416-417

  Vaudin, M D ^a   Stan, G ^a   Gerbig, Y B ^a   Cook, R F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 69949118748     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609093076     Document Type: Article

References (2)

1. A.F. Wilkinson, G. Meaden, and D.J. Dingley, Ultramicroscopy 106, 307 (2006)
2. M.D. Vaudin, Y.B. Gerbig, S.J. Stranick and R.F. Cook, Appl. Phys. Letts. 93, 193116 (2008)