Source point calibration from an arbitrary electron backscattering pattern

Journal of Microscopy

Volumn 195, Issue 3, 1999, Pages 204-211

  Krieger Lassen, N C ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Backscatter Kikuchi pattern; BKP; Calibration; Crystal orientation; EBSD; EBSP; Electron backscatter diffraction; Electron backscattering pattern; Electron diffraction; Evolutionary algorithm; Global optimization; Indexing; Kikuchi lines

Indexed keywords

BACKSCATTERING; BISMUTH COMPOUNDS; CALIBRATION; CRYSTAL ORIENTATION; ELECTRONS; GLOBAL OPTIMIZATION; INDEXING (OF INFORMATION); LOCATION;

BACKSCATTER KIKUCHI PATTERN; BKP; EBSD; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; ELECTRON BACKSCATTERING PATTERNS; GLOBAL OPTIMISATION; INDEXING; KIKUCHI LINES; KIKUCHI PATTERNS;

ELECTRON DIFFRACTION;

ARTICLE; CALIBRATION; CONDUCTOR; CRYSTALLOGRAPHY; ELECTRON BEAM; ELECTRON DIFFRACTION; MATHEMATICAL ANALYSIS; PRIORITY JOURNAL;

EID: 0032854054     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00581.x     Document Type: Article

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