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Volumn 98, Issue 7, 2011, Pages

Effect of edge threading dislocations on the electronic structure of InN

Author keywords

[No Author keywords available]

Indexed keywords

BAND GAPS; CONDUCTION-BAND MINIMUM; DISLOCATION CORE; EDGE THREADING; ELECTRON CONCENTRATION; FIRST-PRINCIPLES CALCULATION; N-TYPE CONDUCTIVITY; STRAIN-INDUCED INTERACTION; THREADING DISLOCATION; VALENCE-BAND MAXIMUMS;

EID: 79951931842     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3553772     Document Type: Article
Times cited : (25)

References (23)
  • 5
    • 34247269231 scopus 로고    scopus 로고
    • Threading dislocations in In-polar InN films and their effects on surface morphology and electrical properties
    • DOI 10.1063/1.2720717
    • X. Wang, S. -B. Che, Y. Ishitani, and A. Yoshikawa, Appl. Phys. Lett. 0003-6951 90, 151901 (2007). 10.1063/1.2720717 (Pubitemid 46609824)
    • (2007) Applied Physics Letters , vol.90 , Issue.15 , pp. 151901
    • Wang, X.1    Che, S.-B.2    Ishitani, Y.3    Yoshikawa, A.4
  • 11
    • 0037095513 scopus 로고    scopus 로고
    • 0556-2805, 10.1103/PhysRevB.65.205323
    • A. B́ŕ and A. Serra, Phys. Rev. B 0556-2805 65, 205323 (2002). 10.1103/PhysRevB.65.205323
    • (2002) Phys. Rev. B , vol.65 , pp. 205323
    • B́ŕ, A.1    Serra, A.2
  • 21
    • 33750316327 scopus 로고    scopus 로고
    • Origins of Fermi-level pinning on GaN and InN polar and nonpolar surfaces
    • DOI 10.1209/epl/i2006-10250-2
    • D. Segev and C. G. Vand de Walle, Europhys. Lett. 0295-5075 76, 305 (2006). 10.1209/epl/i2006-10250-2 (Pubitemid 44620860)
    • (2006) Europhysics Letters , vol.76 , Issue.2 , pp. 305-311
    • Segev, D.1    Van De Walle, C.G.2
  • 22
    • 34247863807 scopus 로고    scopus 로고
    • Microscopic origins of surface states on nitride surfaces
    • DOI 10.1063/1.2722731
    • C. G. Van de Walle and D. Segev, J. Appl. Phys. 0021-8979 101, 081704 (2007). 10.1063/1.2722731 (Pubitemid 46691125)
    • (2007) Journal of Applied Physics , vol.101 , Issue.8 , pp. 081704
    • Van De Walle, C.G.1    Segev, D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.