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Volumn 110, Issue 8, 2011, Pages

Enhancements of extreme ultraviolet emission using prepulsed Sn laser-produced plasmas for advanced lithography applications

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED LITHOGRAPHY; DELAY TIMING; EUV EMISSIONS; EXTREME ULTRAVIOLET EMISSION; EXTREME ULTRAVIOLETS; GARNET LASERS; INITIAL OPTIMIZATION; ION SIGNALS; LASER INTENSITIES; LITHOGRAPHY SYSTEMS; NEXT GENERATION LITHOGRAPHY; PUMPING PULSE; REDUCED COST;

EID: 80655139274     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3647779     Document Type: Article
Times cited : (55)

References (29)
  • 1
    • 80655127963 scopus 로고    scopus 로고
    • edited by V. Bakshi (SPIE and John Wiley Sons, Inc., Bellingham, WA/Hoboken, NJ)
    • J. S. Taylor and R. Soufli, in EUV Lithography, edited by, V. Bakshi, (SPIE and John Wiley Sons, Inc., Bellingham, WA/Hoboken, NJ, 2009), p. 188.
    • (2009) EUV Lithography , pp. 188
    • Taylor, J.S.1    Soufli, R.2
  • 5
    • 84960259042 scopus 로고    scopus 로고
    • edited by V. Bakshi (SPIE - The International Society for Optical Engineering, Bellingham, WA)
    • V. Bakshi, in EUV Sources for Lithography, edited by, V. Bakshi, (SPIE - The International Society for Optical Engineering, Bellingham, WA, 2006).
    • (2006) EUV Sources for Lithography
    • Bakshi, V.1
  • 9
    • 80655149277 scopus 로고    scopus 로고
    • papter presented at San Jose, CA, 27 February (SEMATECH Inc., EUV Source Workshop)
    • J. Pankert, in papter presented at EUV Source on Philips's EUV Source: Update and Issues, San Jose, CA, 27 February 2005 (SEMATECH Inc., EUV Source Workshop).
    • (2005) EUV Source on Philips's EUV Source: Update and Issues
    • Pankert, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.