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Volumn 6921, Issue , 2008, Pages

Advanced laser-produced EUV light source for HVM with conversion efficiency of 5-7% and B-field mitigation of ions

Author keywords

Conversion efficiency from laser to euv; Debris mitigation; EUVL (Extreme ultraviolet light source for lithography); Ion mitigation by magnetic field; LPP (Laser produced plasma); Radiation hydrodynamic simulation; Tin cleaning; Tin plasma

Indexed keywords

13.5 NM; DEBRIS MITIGATION; DOUBLE PULSE LASER; ENERGY REDUCTION; EUV LIGHT SOURCES; EXTREME ULTRAVIOLET EMISSION; HIGH CONVERSION EFFICIENCY; HYDRO CODES; ION SPUTTERING; LASER ENERGIES; MAGNETIC COIL; MAIN PULSE; MD SIMULATION; ND : YAG LASERS; OUT OF BAND; PREPULSES; RADIATION HYDRODYNAMIC SIMULATION; TIN DROPLETS; TIN PLASMA; TWO-COLOR LASER;

EID: 78649267951     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.769086     Document Type: Conference Paper
Times cited : (9)

References (32)
  • 1
    • 84960259042 scopus 로고    scopus 로고
    • For example, (SPIE Press, Edited by V. Bakshi, Bellingham, WA)
    • For example, EUV Sources for Lithography (SPIE Press, Edited by V. Bakshi, Bellingham, WA, 2006), Vol. PM149.
    • (2006) EUV Sources for Lithography , vol.PM149


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.