Measuring relative barrier heights in molecular electronic junctions with transition voltage spectroscopy

ACS Nano

Volumn 2, Issue 5, 2008, Pages 827-832

  Beebe, Jeremy M ^a   Kim, BongSoo ^b   Frisbei, C Daniel ^b   Kushmerick, James G ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b University of Minnesota   (United States)

Author keywords

Charge transport; Molecular electronics; Transition voltage spectroscopy; Tunneling

Indexed keywords

CHARGE CARRIERS; ELECTRIC POTENTIAL; ELECTRICITY; EMISSION SPECTROSCOPY; FIELD EMISSION; MEASUREMENTS; MOLECULAR ELECTRONICS; MOLECULAR STRUCTURE; ORGANIC POLYMERS; SPECTRUM ANALYSIS;

ALKANETHIOL MOLECULES; AMERICAN CHEMICAL SOCIETY (ACS); BARRIER HEIGHT (BH); CARRIER (CO); CHARGE TRANSPORTING; CONJUGATED MOLECULES; DIRECT TUNNELING (DT); ELECTRICAL BEHAVIORS; ELECTRONIC JUNCTIONS; MOLECULAR DEVICES; MOLECULAR ELECTRONIC DEVICES; MOLECULAR JUNCTIONS; MOLECULAR LENGTHS; TRANSITION (JEL CLASSIFICATIONS:E52 ,E41 ,E31); TRANSITION VOLTAGE;

MOLECULES;

NANOMATERIAL;

ARTICLE; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SEMICONDUCTOR; SPECTROSCOPY;

COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; MATERIALS TESTING; MODELS, CHEMICAL; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SEMICONDUCTORS; SPECTRUM ANALYSIS;

EID: 45749104453     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn700424u     Document Type: Article

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