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Volumn 4, Issue 10, 2011, Pages 4252-4257

Nanoprobe X-ray fluorescence characterization of defects in large-area solar cells

Author keywords

[No Author keywords available]

Indexed keywords

BEAM-LINES; DEVICE EFFICIENCY; ENERGY DEVICES; ENERGY SYSTEMS; HIGH RESOLUTION; HIGH-RESOLUTION MEASUREMENTS; INDUSTRIAL SOLAR CELLS; INTRA-GRANULAR DEFECTS; LARGE-AREA SOLAR CELLS; LENGTH SCALE; MULTISCALE NATURE; NANO SCALE; NANOSCALE DEFECTS; NON-DESTRUCTIVE TECHNIQUE; RESOLUTION LIMITS; SPATIAL RESOLUTION; SUBMICRON; X RAY FLUORESCENCE; XRAY IMAGING;

EID: 80053298311     PISSN: 17545692     EISSN: 17545706     Source Type: Journal    
DOI: 10.1039/c1ee02083h     Document Type: Article
Times cited : (55)

References (47)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.