SCOPUS 정보 검색 플랫폼

Volumn 340-342, Issue , 2003, Pages 1137-1141

Applications of synchrotron radiation X-ray techniques on the analysis of the behavior of transition metals in solar cells and single-crystalline silicon with extended defects

(9) Buonassisi, T a Heuer, M a Vyvenko, O F b Istratov, A A a Weber, E R a Cai, Z c Lai, B c Ciszek, T F d Schindler, R e

a UNIVERSITY OF CALIFORNIA (United States)

b ST PETERSBURG STATE UNIVERSITY (Russian Federation)

c ARGONNE NATIONAL LABORATORY (United States)

d NATIONAL RENEWABLE ENERGY LABORATORY (United States)

e FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE (Germany)

Author keywords

Multicrystalline silicon; Solar cells; Transition metals; X ray fluorescence

Indexed keywords

ABSORPTION SPECTROSCOPY; COMPUTER SOFTWARE; COPPER; FLUORESCENCE; MONOCHROMATORS; OXIDATION; PHOTOVOLTAIC EFFECTS; PRECIPITATION (CHEMICAL); SINGLE CRYSTALS; SOLAR CELLS; SYNCHROTRON RADIATION; X RAY SPECTROSCOPY;

MULTICRYSTALLINE SILICON; X-RAY FLUORESCENCE;

SILICON;

EID: 0346685969 PISSN: 09214526 EISSN: None Source Type: Journal
DOI: 10.1016/j.physb.2003.09.099 Document Type: Conference Paper

Times cited : (24)

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