Numerical study of the lateral resolution in electrostatic force microscopy for dielectric samples

Nanotechnology

Volumn 22, Issue 28, 2011, Pages

  Riedel, C ^a,b,c   Alegria A ^a,d   Schwartz, G A ^d   Colmenero, J ^a,b,d   Senz, J J ^b,c  

^a UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

^b DONOSTIA INTERNATIONAL PHYSICS CENTER DIPC   (Spain)

^c INSTITUTO NICOLÁS CABRERA   (Spain)

^d CENTRO MIXTO CSIC UPV EHU   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERISTIC THICKNESS; DIELECTRIC MEDIUM; DIELECTRIC SURFACE; ELECTROSTATIC FORCE MICROSCOPY; EQUIVALENT CHARGES; EXPERIMENTAL CONDITIONS; EXPERIMENTAL PARAMETERS; KELVIN PROBE FORCE MICROSCOPY; LATERAL RESOLUTION; METALLIC BEHAVIOUR; METALLIC SURFACE; NUMERICAL STUDIES; POINT CHARGE; POLARIZABLE PARTICLES; SAMPLE THICKNESS; TEST PARTICLES; TIP-SAMPLE DISTANCE;

DIELECTRIC DEVICES; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; METALLIC COMPOUNDS; NUMERICAL METHODS; SURFACE MEASUREMENT;

ELECTRIC FORCE MICROSCOPY;

EID: 79959218732     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/22/28/285705     Document Type: Article

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