SCOPUS 정보 검색 플랫폼

Volumn 21, Issue 2, 1988, Pages 147-151

Scanning capacitance microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC MEASUREMENTS - CAPACITANCE; PROBES;

CAPACITANCE MODULATION; CONDUCTING BACKPLANE; SCANNING CAPACITANCE MICROSCOPY; SURFACE MICROTOPOGRAPHY;

MICROSCOPIC EXAMINATION;

EID: 0023960467 PISSN: 00223735 EISSN: None Source Type: Journal
DOI: 10.1088/0022-3735/21/2/003 Document Type: Article

Times cited : (90)

References (6)

1
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- (1986) Phys. Rev. Lett. , vol.56 , Issue.9 , pp. 930-933
- Binnig, Q¹ Quate, CF² Gerber, C³

2
- 0001965544
- Scanning tunneling microscopy
- (1985) Surface Science , vol.152-153 , pp. 17-26
- Binnig, G¹ Rohrer, H²

3
- 84926584098
- Vacuum Tunneling: A New Technique for Microscopy
- (1986) Physics Today , pp. 26-33
- Quate, CF¹

4
- 0020331260
- (1982) Wear , vol.83 , Issue.1 , pp. 1-12
- Teague, EC¹ Scire, FE² Baker, SM³ Jenson, SW⁴

5
- 0020190642
- Differential phase contrast optical microscope with 1 Å-depth resolution
- (1982) Electronics Letters , vol.18 , Issue.22 , pp. 973-975
- Wickramasinghe, HK¹ Ameri, S² See, CW³

6
- 0000704117
- (1972) Rev. Sci. Instrum. , vol.43 , Issue.7 , pp. 999-1011
- Young, RD¹ Ward, J² Scire, F³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.