Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 81, Issue 1, 2010, Pages

  Riedel, C ^a,b,c   Arinero, R ^a   Tordjeman, Ph ^d   Leveque G ^a   Schwartz, G A ^e   Alegria, A ^c,e   Colmenero, J ^b,c,e  

^a UNIVERSITÉ MONTPELLIER II   (France)

^b DONOSTIA INTERNATIONAL PHYSICS CENTER DIPC   (Spain)

^c UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

^d UNIVERSITÉ DE TOULOUSE   (France)

^e CENTRO MIXTO CSIC UPV EHU   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PERMITTIVITIES; DOUBLE PASS; ELECTROSTATIC FORCE MICROSCOPY; EQUIVALENT CHARGES; FREQUENCY SHIFT; IMAGE POINTS; NANO SCALE; NUMERICAL TREATMENTS; SIMPLE METHOD; SOFT MATERIAL; TIP RADIUS;

DIELECTRIC MATERIALS; ELECTROSTATIC DEVICES; ELECTROSTATIC FORCE; IMAGE PROCESSING; PERMITTIVITY; POLYMER BLENDS; POLYSTYRENES; POLYVINYL ACETATES;

ELECTRIC FORCE MICROSCOPY;

EID: 75349092546     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.81.010801     Document Type: Article

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