A resolution study for electrostatic force microscopy on bimetallic samples using the boundary element method

Nanotechnology

Volumn 19, Issue 3, 2008, Pages

  Shen, Yongxing ^a   Lee, Minhwan ^a   Lee, Wonyoung ^a   Barnett, David M ^a   Pinsky, Peter M ^a   Prinz, Friedrich B ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY ELEMENT METHOD; ELECTROSTATIC FORCE; MEASUREMENT THEORY; MICROSCOPIC EXAMINATION;

ELECTROSTATIC FORCE MICROSCOPY (EFM); SURFACE POTENTIAL DISTRIBUTION;

BIMETALS;

AMPLITUDE MODULATION; ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTALLOGRAPHY; DIELECTRIC CONSTANT; ELECTRIC CONDUCTIVITY; ELECTRICITY; ELECTROSTATIC FORCE MICROSCOPY; ELECTROSTIMULATION; FREQUENCY MODULATION; MECHANICAL PROBE; NOISE; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; SCANNING PROBE MICROSCOPY;

EID: 38649116663     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/03/035710     Document Type: Article

References (21)

1. Stern J E, Terris B D, Mamin H J and Rugar D 1988 Appl. Phys. Lett. 53 2717-9
2. Nonnenmacher M, O'Boyle M P and Wickramasinghe H K 1991 Appl. Phys. Lett. 58 2921-3
3. Hudlet S, Saint Jean M, Guthmann C and Berger J 1998 Eur. Phys. J. B 2 5-10
4. Pan L, Sullivan Th E, Peridier V J, Cutler P H and Miskovsky N M 1994 Appl. Phys. Lett. 65 2151-3
5. Colchero J, Gil A and Baró A M 2001 Phys. Rev. B 64 245403
6. Terris B D, Stern J E, Rugar D and Mamin H J 1989 Phys. Rev. Lett. 63 2669-72
7. Hao H W, Baró A M and Sáenz J J 1991 J. Vac. Sci. Technol. B 9 1323-8
8. Sadewasser S, Glatzel Th, Shikler R, Rosenwaks Y and Lux-Steiner M Ch 2003 Appl. Surf. Sci. 210 32-6
9. Takahashi T and Ono S 2004 Ultramicroscopy 100 287-92
10. Watanabe S, Hane K, Ohye T, Ito M and Goto T 1993 J. Vac. Sci. Technol. B 11 1774-81
11. Belaidi S, Lebon F, Girard P, Leveque G and Pagano S 1998 Appl. Phys. A 66 S239-43
12. Gómez-Mõivas S, Froufe L S, Carminati R, Greffet J J and Sáenz J J 2001 Nanotechnology 12 496-9
13. Jacobs H O, Leuchtmann P, Homan O J and Stemmer A 1998 J. Appl. Phys. 84 1168-73
14. Jackson J D 1999 Classical Electrodynamics (New York: Wiley) p 261
15. Strassburg E, Boag A and Rosenwaks Y 2005 Rev. Sci. Instrum. 76 083705
16. Smythe W R 1968 Static and Dynamic Electricity (New York: McGraw-Hill) pp 131-2
17. Ducker W A and Cook R F 1990 Appl. Phys. Lett. 56 2408-10
18. Martin Y, Willams C C and Wickramasinghe H K 1987 J. Appl. Phys. 61 4723-9
19. Butt H and Jaschke M 1995 Nanotechnology 6 1-7
20. Lee D W, Ono T and Esashi M 2000 Sensors Actuators 83 11-6
21. Press W H, Teukolsky S A, Vetterling W T and Flannery B P 1986 Numerical Recipes in FORTRAN: the Art of Scientific Computing (New York: Cambridge University Press) pp 390-9