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Volumn 96, Issue 21, 2010, Pages

Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED ELECTRIC FIELD; DIELECTRIC RESPONSE; DYNAMIC DOMAINS; ELECTROSTATIC FORCE MICROSCOPY; FIXED FREQUENCY; FORCE GRADIENTS; FREQUENCY DEPENDENCE; GLASS TRANSITION TEMPERATURE; IN-PHASE; LATERAL RESOLUTION; LOCAL FREQUENCY; MODEL SYSTEM; NANO SCALE; NANOSTRUCTURED POLYMERS; SPATIAL RESOLUTION; SPATIAL VARIATIONS;

EID: 77956243928     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3431288     Document Type: Article
Times cited : (52)

References (18)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.