-
1
-
-
33646900503
-
Device scaling limits of Si MOSFETs and their application dependencies
-
D.J. Frank, R.H. Dennard, E. Nowak, P.M. Solomon, Y. Taur, and H.-S.P. Wong Device scaling limits of Si MOSFETs and their application dependencies Proc IEEE 89 March 2001 259 288
-
(2001)
Proc IEEE
, vol.89
, Issue.MARCH
, pp. 259-288
-
-
Frank, D.J.1
Dennard, R.H.2
Nowak, E.3
Solomon, P.M.4
Taur, Y.5
Wong, H.-S.P.6
-
2
-
-
0032284102
-
Device design considerations for double-gate, ground plane and single-gate ultra-thin SOI MOSFETs at the 25 nm channel length generation
-
H.-S.P. Wong, D.J. Frank, and P.M. Solomon Device design considerations for double-gate, ground plane and single-gate ultra-thin SOI MOSFETs at the 25 nm channel length generation IEDM Tech Dig 1998 407 410
-
(1998)
IEDM Tech Dig
, pp. 407-410
-
-
Wong, H.-S.P.1
Frank, D.J.2
Solomon, P.M.3
-
3
-
-
0031143076
-
Back-gated CMOS on SOIAS for dynamic threshold voltage control
-
PII S0018938397030086
-
I.Y. Yang, C. Vieri, A. Chandrakasan, and D.A. Antoniadis Back-gated CMOS on SOIAS for dynamic threshold voltage control IEEE Trans Electron Dev 44 5 1997 822 831 (Pubitemid 127764595)
-
(1997)
IEEE Transactions on Electron Devices
, vol.44
, Issue.5
, pp. 822-831
-
-
Yang, I.Y.1
Vieri, C.2
Chandrakasan, A.3
Antoniadis, D.A.4
-
4
-
-
0032320827
-
Random dopant induced threshold voltage lowering and fluctuations in sub-0.1 fjim MOSFET's: A 3-D "atomistic" simulation study
-
PII S001893839809025X
-
A. Asenov Random dopant induced threshold voltage lowering and fluctuations in Sub-0.1μm MOSFET's: A 3-D 'Atomistic' simulation study IEEE Trans Electron Dev 45 12 1996 2505 2513 (Pubitemid 128736693)
-
(1998)
IEEE Transactions on Electron Devices
, vol.45
, Issue.12
, pp. 2505-2513
-
-
Asenov, A.1
-
5
-
-
0141940281
-
A physical compact model of DG MOSFET for mixed-signal circuit applications - Part I: Model description
-
G. Pei, W. Ni, A.V. Kammula, B.A. Minch, and E.C.-C. Kan A physical compact model of DG MOSFET for mixed-signal circuit applications - part I: model description IEEE Trans Electron Dev 50 10 2003 2135 2143
-
(2003)
IEEE Trans Electron Dev
, vol.50
, Issue.10
, pp. 2135-2143
-
-
Pei, G.1
Ni, W.2
Kammula, A.V.3
Minch, B.A.4
Kan, E.C.-C.5
-
6
-
-
65049090425
-
Continuous model for independent double gate MOSFET
-
M. Reyboz, P. Martin, T. Poirous, and O. Rozeau Continuous model for independent double gate MOSFET Solid State Electron 53 5 2009 504 513
-
(2009)
Solid State Electron
, vol.53
, Issue.5
, pp. 504-513
-
-
Reyboz, M.1
Martin, P.2
Poirous, T.3
Rozeau, O.4
-
7
-
-
1442360373
-
A process/physics-based compact model for nonclassical CMOS device and circuit design
-
J.G. Fossum, L. Ge, M.-H. Chiang, V.P. Trivedi, M.M. Chowdhury, and L. Mathew A process/physics-based compact model for nonclassical CMOS device and circuit design Solid State Electron 48 2004 919 926
-
(2004)
Solid State Electron
, vol.48
, pp. 919-926
-
-
Fossum, J.G.1
Ge, L.2
Chiang, M.-H.3
Trivedi, V.P.4
Chowdhury, M.M.5
Mathew, L.6
-
8
-
-
33646033169
-
An analytical potential model for symmetric and asymmetric DG MOSFETs
-
H. Lu, and Y. Taur An analytical potential model for symmetric and asymmetric DG MOSFETs IEEE Trans Electron Dev 53 May 2006 1161 1168
-
(2006)
IEEE Trans Electron Dev
, vol.53
, Issue.MAY
, pp. 1161-1168
-
-
Lu, H.1
Taur, Y.2
-
9
-
-
34547372388
-
Drain current and transconductance model for the undoped body asymmetric double-gate MOSFET
-
October
-
Oritz-Conde A, García-Sánchez FJ, Malobabic S, Muci J, Salazar R. Drain current and transconductance model for the undoped body asymmetric double-gate MOSFET. In: Proceedings of the international conference on solid-state and integrated circuit technology; October 2006. p. 1239-42.
-
(2006)
Proceedings of the International Conference on Solid-state and Integrated Circuit Technology
, pp. 1239-1242
-
-
Oritz-Conde, A.1
García-Sánchez, F.J.2
Malobabic, S.3
Muci, J.4
Salazar, R.5
-
10
-
-
33947123645
-
Completely surface-potential-based compact model of the fully depleted SOI-MOSFET including short-channel effects
-
N. Sadachika Completely surface-potential-based compact model of the fully depleted SOI-MOSFET including short-channel effects IEEE Trans Electron Dev 53 9 2006 2017 2024
-
(2006)
IEEE Trans Electron Dev
, vol.53
, Issue.9
, pp. 2017-2024
-
-
Sadachika, N.1
-
11
-
-
33646535276
-
A closed-form charge-based expression for drain current in symmetric and asymmetric double gate MOSFET
-
A.S. Roy, J.M. Sallese, and C.C. Enz A closed-form charge-based expression for drain current in symmetric and asymmetric double gate MOSFET Solid State Electron 50 4 2006 687 693
-
(2006)
Solid State Electron
, vol.50
, Issue.4
, pp. 687-693
-
-
Roy, A.S.1
Sallese, J.M.2
Enz, C.C.3
-
13
-
-
33846100229
-
Validation of MOSFET model source-drain symmetry
-
DOI 10.1109/TED.2006.881005
-
C.C. McAndrew Validation of MOSFET model source-drain symmetry IEEE Trans Electron Dev 53 9 2009 2202 2206 (Pubitemid 46405145)
-
(2006)
IEEE Transactions on Electron Devices
, vol.53
, Issue.9
, pp. 2202-2206
-
-
McAndrew, C.C.1
-
15
-
-
0035247818
-
Analytical approximation for the MOSFET surface potential
-
DOI 10.1016/S0038-1101(00)00283-5
-
T.L. Chen, and G. Gildenblat Analytical approximation for the MOSFET surface potential Solid State Electron 45 2 2001 335 339 (Pubitemid 32264516)
-
(2001)
Solid-State Electronics
, vol.45
, Issue.2
, pp. 335-339
-
-
Chen, T.L.1
Gildenblat, G.2
-
17
-
-
35148871165
-
Explicit continuous models for double-gate and surrounding-gate MOSFETs
-
DOI 10.1109/TED.2007.904410
-
B. Yu, H. Lu, M. Liu, and Y. Taur Explicit continuous models for double-gate and surrounding-gate MOSFETs IEEE Trans Electron Dev 54 10 2007 2715 2722 (Pubitemid 47534491)
-
(2007)
IEEE Transactions on Electron Devices
, vol.54
, Issue.10
, pp. 2715-2722
-
-
Yu, B.1
Lu, H.2
Liu, M.3
Taur, Y.4
-
18
-
-
79957943539
-
-
Synopsys Inc.
-
"Taurus-Device," Synopsys Inc.; 2002.
-
(2002)
Taurus-Device
-
-
-
19
-
-
79957935351
-
Model implementation and verification facilities for psim
-
October 29
-
Gummel HK. Model implementation and verification facilities for psim. AT&T Bell Laboratories Technical Note; October 29. 1990.
-
(1990)
AT&T Bell Laboratories Technical Note
-
-
Gummel, H.K.1
-
21
-
-
0023421993
-
Double-gate silicon-on-insulator transistor with volume inversion: A new device with greatly enhanced performance
-
F. Balestra, S. Cristoloveanu, M. Benachir, J. Brini, and T. Elewa Double-gate silicon-on-insulator transistor with volume inversion: a new device with greatly enhanced performance IEEE Electron Dev Lett 8 9 1987 410 412 (Pubitemid 17650855)
-
(1987)
Electron device letters
, vol.EDL-8
, Issue.9
, pp. 410-412
-
-
Balestra, F.1
Cristoloveanu, S.2
Benachir, M.3
Brini, J.4
Elewa, T.5
-
22
-
-
79957955994
-
-
[Online] available: < http://www-device.eecs.berkeley.edu/~bsim/ >.
-
-
-
-
23
-
-
79957960343
-
-
Synopsys Inc.
-
"HSpice," Synopsys Inc.; 2007.
-
(2007)
HSpice
-
-
-
24
-
-
0017932965
-
A charge-sheet model of the MOSFET
-
J. Brews A charge-sheet model of the MOSFET Solid State Electron 21 2 1978 345 355
-
(1978)
Solid State Electron
, vol.21
, Issue.2
, pp. 345-355
-
-
Brews, J.1
-
25
-
-
50249107489
-
A multi-gate MOSFET compact model featuring independent-gate operation
-
D.D. Lu, M.V. Dunga, C.-H. Lin, A.M. Niknejad, and C. Hu A multi-gate MOSFET compact model featuring independent-gate operation IEDM Tech Dig 2007 565 568
-
(2007)
IEDM Tech Dig
, pp. 565-568
-
-
Lu, D.D.1
Dunga, M.V.2
Lin, C.-H.3
Niknejad, A.M.4
Hu, C.5
-
26
-
-
0031646543
-
An improvedMOSFET model for circuit simulation
-
PII S0018938398011587
-
K. Jordar, K.K. Gullapalli, C.C. McAndrew, M.E. Burnham, and A. Wild An improved MOSFET model for circuit simulation IEEE Trans Electron Dev 45 1 1998 134 148 (Pubitemid 128743214)
-
(1998)
IEEE Transactions on Electron Devices
, vol.45
, Issue.1
, pp. 134-148
-
-
Joardar, K.1
Gullapalli, K.K.2
McAndrew, C.C.3
Burnham, M.E.4
Wild, A.5
-
27
-
-
0141786921
-
Improved independent gate N-Type FinFET fabrication and characterization
-
D.M. Fried, J.S. Duster, and K.T. Kornegay Improved independent gate N-Type FinFET fabrication and characterization IEEE Electron Dev Lett 25 4 2003 592 594
-
(2003)
IEEE Electron Dev Lett
, vol.25
, Issue.4
, pp. 592-594
-
-
Fried, D.M.1
Duster, J.S.2
Kornegay, K.T.3
-
28
-
-
0018027059
-
A charge-oriented model for MOS transistor capacitances
-
D.E. Ward, and R.W. Dutton A charge-oriented model for MOS transistor capacitances IEEE J Solid-State Circ 13 5 1978 703 708
-
(1978)
IEEE J Solid-State Circ
, vol.13
, Issue.5
, pp. 703-708
-
-
Ward, D.E.1
Dutton, R.W.2
-
30
-
-
23844491449
-
Quantum-mechanical effects on the threshold voltage of undoped double-gate MOSFETs
-
DOI 10.1109/LED.2005.852741
-
V.P. Trivedi, and J.G. Fossum Quantum-mechanical effects on the threshold voltage of undoped double-gate MOSFETs IEEE Electron Dev Lett 26 8 2005 579 582 (Pubitemid 41179180)
-
(2005)
IEEE Electron Device Letters
, vol.26
, Issue.8
, pp. 579-582
-
-
Trivedi, V.P.1
Fossum, J.G.2
-
31
-
-
0031369121
-
Modeling the threshold voltage of long and short-channel fully depleted SOI MOFSETs with back gate substrate induced surface effects
-
September
-
Imam MA, Osman MA, Osman AA. Modeling the threshold voltage of long and short-channel fully depleted SOI MOFSETs with back gate substrate induced surface effects. In: Proceedings of the 21st international conference on microelectronics; September 1997. p. 343-6.
-
(1997)
Proceedings of the 21st International Conference on Microelectronics
, pp. 343-346
-
-
Imam, M.A.1
Osman, M.A.2
Osman, A.A.3
-
32
-
-
20144387099
-
CMOS vertical multiple independent gate field effect transistor (MIGFET)
-
October
-
Matthew L, et al. CMOS vertical multiple independent gate field effect transistor (MIGFET). Proceedings of the IEEE international SOI conference; October 2004. p. 187-9.
-
(2004)
Proceedings of the IEEE International SOI Conference
, pp. 187-189
-
-
Matthew, L.1
-
33
-
-
0035694506
-
Analytic solutions of charge and capacitance in symmetric and asymmetric double-gate MOSFETs
-
DOI 10.1109/16.974719, PII S0018938301101115
-
Y. Taur Analytic solutions of charge and capacitance in symmetric and asymmetric double-gate MOSFETs IEEE Trans Electron Dev 48 12 2001 2861 2869 (Pubitemid 34091900)
-
(2001)
IEEE Transactions on Electron Devices
, vol.48
, Issue.12
, pp. 2861-2869
-
-
Taur, Y.1
|