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Volumn 62, Issue 1, 2011, Pages 31-39

A computationally efficient compact model for fully-depleted SOI MOSFETs with independently-controlled front- and back-gates

Author keywords

Berkeley short channel insulated gate FET model (BSIM); Compact modeling; Computational efficiency; Double gate MOSFET; Fully depleted SOI MOSFET

Indexed keywords

APPROXIMATION SCHEME; BACK-GATE; CHARGE MODELS; CHARGE-SHEET APPROXIMATION; COMPACT MODEL; COMPACT MODELING; COMPUTATIONAL TIME; COMPUTATIONALLY EFFICIENT; CONVERGENCE DIFFICULTY; DOUBLE-GATE DEVICE; DOUBLE-GATE MOSFET; EXPLICIT ANALYTICAL EQUATION; FULL MODEL; FULLY DEPLETED; INSULATED GATE; NONIDEAL EFFECTS; NUMERICAL ITERATION; RING OSCILLATOR CIRCUITS; SOI-MOSFETS; SOURCE-DRAIN; SURFACE-POTENTIAL-BASED MODELS; TCAD SIMULATION; TRANSIENT SIMULATION; VERILOG-A; VOLUME INVERSION;

EID: 79957942166     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2010.12.015     Document Type: Article
Times cited : (27)

References (33)
  • 1
    • 33646900503 scopus 로고    scopus 로고
    • Device scaling limits of Si MOSFETs and their application dependencies
    • D.J. Frank, R.H. Dennard, E. Nowak, P.M. Solomon, Y. Taur, and H.-S.P. Wong Device scaling limits of Si MOSFETs and their application dependencies Proc IEEE 89 March 2001 259 288
    • (2001) Proc IEEE , vol.89 , Issue.MARCH , pp. 259-288
    • Frank, D.J.1    Dennard, R.H.2    Nowak, E.3    Solomon, P.M.4    Taur, Y.5    Wong, H.-S.P.6
  • 2
    • 0032284102 scopus 로고    scopus 로고
    • Device design considerations for double-gate, ground plane and single-gate ultra-thin SOI MOSFETs at the 25 nm channel length generation
    • H.-S.P. Wong, D.J. Frank, and P.M. Solomon Device design considerations for double-gate, ground plane and single-gate ultra-thin SOI MOSFETs at the 25 nm channel length generation IEDM Tech Dig 1998 407 410
    • (1998) IEDM Tech Dig , pp. 407-410
    • Wong, H.-S.P.1    Frank, D.J.2    Solomon, P.M.3
  • 4
    • 0032320827 scopus 로고    scopus 로고
    • Random dopant induced threshold voltage lowering and fluctuations in sub-0.1 fjim MOSFET's: A 3-D "atomistic" simulation study
    • PII S001893839809025X
    • A. Asenov Random dopant induced threshold voltage lowering and fluctuations in Sub-0.1μm MOSFET's: A 3-D 'Atomistic' simulation study IEEE Trans Electron Dev 45 12 1996 2505 2513 (Pubitemid 128736693)
    • (1998) IEEE Transactions on Electron Devices , vol.45 , Issue.12 , pp. 2505-2513
    • Asenov, A.1
  • 5
    • 0141940281 scopus 로고    scopus 로고
    • A physical compact model of DG MOSFET for mixed-signal circuit applications - Part I: Model description
    • G. Pei, W. Ni, A.V. Kammula, B.A. Minch, and E.C.-C. Kan A physical compact model of DG MOSFET for mixed-signal circuit applications - part I: model description IEEE Trans Electron Dev 50 10 2003 2135 2143
    • (2003) IEEE Trans Electron Dev , vol.50 , Issue.10 , pp. 2135-2143
    • Pei, G.1    Ni, W.2    Kammula, A.V.3    Minch, B.A.4    Kan, E.C.-C.5
  • 6
    • 65049090425 scopus 로고    scopus 로고
    • Continuous model for independent double gate MOSFET
    • M. Reyboz, P. Martin, T. Poirous, and O. Rozeau Continuous model for independent double gate MOSFET Solid State Electron 53 5 2009 504 513
    • (2009) Solid State Electron , vol.53 , Issue.5 , pp. 504-513
    • Reyboz, M.1    Martin, P.2    Poirous, T.3    Rozeau, O.4
  • 8
    • 33646033169 scopus 로고    scopus 로고
    • An analytical potential model for symmetric and asymmetric DG MOSFETs
    • H. Lu, and Y. Taur An analytical potential model for symmetric and asymmetric DG MOSFETs IEEE Trans Electron Dev 53 May 2006 1161 1168
    • (2006) IEEE Trans Electron Dev , vol.53 , Issue.MAY , pp. 1161-1168
    • Lu, H.1    Taur, Y.2
  • 10
    • 33947123645 scopus 로고    scopus 로고
    • Completely surface-potential-based compact model of the fully depleted SOI-MOSFET including short-channel effects
    • N. Sadachika Completely surface-potential-based compact model of the fully depleted SOI-MOSFET including short-channel effects IEEE Trans Electron Dev 53 9 2006 2017 2024
    • (2006) IEEE Trans Electron Dev , vol.53 , Issue.9 , pp. 2017-2024
    • Sadachika, N.1
  • 11
    • 33646535276 scopus 로고    scopus 로고
    • A closed-form charge-based expression for drain current in symmetric and asymmetric double gate MOSFET
    • A.S. Roy, J.M. Sallese, and C.C. Enz A closed-form charge-based expression for drain current in symmetric and asymmetric double gate MOSFET Solid State Electron 50 4 2006 687 693
    • (2006) Solid State Electron , vol.50 , Issue.4 , pp. 687-693
    • Roy, A.S.1    Sallese, J.M.2    Enz, C.C.3
  • 13
    • 33846100229 scopus 로고    scopus 로고
    • Validation of MOSFET model source-drain symmetry
    • DOI 10.1109/TED.2006.881005
    • C.C. McAndrew Validation of MOSFET model source-drain symmetry IEEE Trans Electron Dev 53 9 2009 2202 2206 (Pubitemid 46405145)
    • (2006) IEEE Transactions on Electron Devices , vol.53 , Issue.9 , pp. 2202-2206
    • McAndrew, C.C.1
  • 15
    • 0035247818 scopus 로고    scopus 로고
    • Analytical approximation for the MOSFET surface potential
    • DOI 10.1016/S0038-1101(00)00283-5
    • T.L. Chen, and G. Gildenblat Analytical approximation for the MOSFET surface potential Solid State Electron 45 2 2001 335 339 (Pubitemid 32264516)
    • (2001) Solid-State Electronics , vol.45 , Issue.2 , pp. 335-339
    • Chen, T.L.1    Gildenblat, G.2
  • 17
    • 35148871165 scopus 로고    scopus 로고
    • Explicit continuous models for double-gate and surrounding-gate MOSFETs
    • DOI 10.1109/TED.2007.904410
    • B. Yu, H. Lu, M. Liu, and Y. Taur Explicit continuous models for double-gate and surrounding-gate MOSFETs IEEE Trans Electron Dev 54 10 2007 2715 2722 (Pubitemid 47534491)
    • (2007) IEEE Transactions on Electron Devices , vol.54 , Issue.10 , pp. 2715-2722
    • Yu, B.1    Lu, H.2    Liu, M.3    Taur, Y.4
  • 18
    • 79957943539 scopus 로고    scopus 로고
    • Synopsys Inc.
    • "Taurus-Device," Synopsys Inc.; 2002.
    • (2002) Taurus-Device
  • 19
    • 79957935351 scopus 로고
    • Model implementation and verification facilities for psim
    • October 29
    • Gummel HK. Model implementation and verification facilities for psim. AT&T Bell Laboratories Technical Note; October 29. 1990.
    • (1990) AT&T Bell Laboratories Technical Note
    • Gummel, H.K.1
  • 21
    • 0023421993 scopus 로고
    • Double-gate silicon-on-insulator transistor with volume inversion: A new device with greatly enhanced performance
    • F. Balestra, S. Cristoloveanu, M. Benachir, J. Brini, and T. Elewa Double-gate silicon-on-insulator transistor with volume inversion: a new device with greatly enhanced performance IEEE Electron Dev Lett 8 9 1987 410 412 (Pubitemid 17650855)
    • (1987) Electron device letters , vol.EDL-8 , Issue.9 , pp. 410-412
    • Balestra, F.1    Cristoloveanu, S.2    Benachir, M.3    Brini, J.4    Elewa, T.5
  • 22
    • 79957955994 scopus 로고    scopus 로고
    • [Online] available: < http://www-device.eecs.berkeley.edu/~bsim/ >.
  • 23
    • 79957960343 scopus 로고    scopus 로고
    • Synopsys Inc.
    • "HSpice," Synopsys Inc.; 2007.
    • (2007) HSpice
  • 24
    • 0017932965 scopus 로고
    • A charge-sheet model of the MOSFET
    • J. Brews A charge-sheet model of the MOSFET Solid State Electron 21 2 1978 345 355
    • (1978) Solid State Electron , vol.21 , Issue.2 , pp. 345-355
    • Brews, J.1
  • 25
    • 50249107489 scopus 로고    scopus 로고
    • A multi-gate MOSFET compact model featuring independent-gate operation
    • D.D. Lu, M.V. Dunga, C.-H. Lin, A.M. Niknejad, and C. Hu A multi-gate MOSFET compact model featuring independent-gate operation IEDM Tech Dig 2007 565 568
    • (2007) IEDM Tech Dig , pp. 565-568
    • Lu, D.D.1    Dunga, M.V.2    Lin, C.-H.3    Niknejad, A.M.4    Hu, C.5
  • 27
    • 0141786921 scopus 로고    scopus 로고
    • Improved independent gate N-Type FinFET fabrication and characterization
    • D.M. Fried, J.S. Duster, and K.T. Kornegay Improved independent gate N-Type FinFET fabrication and characterization IEEE Electron Dev Lett 25 4 2003 592 594
    • (2003) IEEE Electron Dev Lett , vol.25 , Issue.4 , pp. 592-594
    • Fried, D.M.1    Duster, J.S.2    Kornegay, K.T.3
  • 28
    • 0018027059 scopus 로고
    • A charge-oriented model for MOS transistor capacitances
    • D.E. Ward, and R.W. Dutton A charge-oriented model for MOS transistor capacitances IEEE J Solid-State Circ 13 5 1978 703 708
    • (1978) IEEE J Solid-State Circ , vol.13 , Issue.5 , pp. 703-708
    • Ward, D.E.1    Dutton, R.W.2
  • 30
    • 23844491449 scopus 로고    scopus 로고
    • Quantum-mechanical effects on the threshold voltage of undoped double-gate MOSFETs
    • DOI 10.1109/LED.2005.852741
    • V.P. Trivedi, and J.G. Fossum Quantum-mechanical effects on the threshold voltage of undoped double-gate MOSFETs IEEE Electron Dev Lett 26 8 2005 579 582 (Pubitemid 41179180)
    • (2005) IEEE Electron Device Letters , vol.26 , Issue.8 , pp. 579-582
    • Trivedi, V.P.1    Fossum, J.G.2
  • 31
    • 0031369121 scopus 로고    scopus 로고
    • Modeling the threshold voltage of long and short-channel fully depleted SOI MOFSETs with back gate substrate induced surface effects
    • September
    • Imam MA, Osman MA, Osman AA. Modeling the threshold voltage of long and short-channel fully depleted SOI MOFSETs with back gate substrate induced surface effects. In: Proceedings of the 21st international conference on microelectronics; September 1997. p. 343-6.
    • (1997) Proceedings of the 21st International Conference on Microelectronics , pp. 343-346
    • Imam, M.A.1    Osman, M.A.2    Osman, A.A.3
  • 32
    • 20144387099 scopus 로고    scopus 로고
    • CMOS vertical multiple independent gate field effect transistor (MIGFET)
    • October
    • Matthew L, et al. CMOS vertical multiple independent gate field effect transistor (MIGFET). Proceedings of the IEEE international SOI conference; October 2004. p. 187-9.
    • (2004) Proceedings of the IEEE International SOI Conference , pp. 187-189
    • Matthew, L.1
  • 33
    • 0035694506 scopus 로고    scopus 로고
    • Analytic solutions of charge and capacitance in symmetric and asymmetric double-gate MOSFETs
    • DOI 10.1109/16.974719, PII S0018938301101115
    • Y. Taur Analytic solutions of charge and capacitance in symmetric and asymmetric double-gate MOSFETs IEEE Trans Electron Dev 48 12 2001 2861 2869 (Pubitemid 34091900)
    • (2001) IEEE Transactions on Electron Devices , vol.48 , Issue.12 , pp. 2861-2869
    • Taur, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.