Validation of MOSFET model source-drain symmetry

IEEE Transactions on Electron Devices

Volumn 53, Issue 9, 2006, Pages 2202-2206

  McAndrew, Colin C ^a  

^a FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

Modeling; MOSFETs; SPICE

Indexed keywords

CIRCUIT SIMULATION; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE TESTING; SPICE;

BULK CURRENTS; MOSFET CHARGE MODELS; SOURCE DRAIN REVERSAL;

MOSFET DEVICES;

EID: 33846100229     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2006.881005     Document Type: Article

References (12)

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