Back-gated CMOS on SOIAS for dynamic threshold voltage control

IEEE Transactions on Electron Devices

Volumn 44, Issue 5, 1997, Pages 822-831

  Yang, Isabel Y ^a   Vieri, Carlin ^a   Chandrakasan, Anantha ^a   Antoniadis, Dimitri A ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISSIPATION; GATES (TRANSISTOR); LEAKAGE CURRENTS; PERFORMANCE; SILICON ON INSULATOR TECHNOLOGY; VOLTAGE CONTROL;

THRESHOLD VOLTAGE;

CMOS INTEGRATED CIRCUITS;

EID: 0031143076     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.568045     Document Type: Article

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