Carrier mobility, band tails and defects in microcrystalline silicon

Journal of Physics: Conference Series

Volumn 253, Issue 1, 2010, Pages

  Reynolds, Steve ^a  

^a UNIVERSITY OF DUNDEE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR SEMICONDUCTOR DEVICES; CARRIER MOBILITY; COMPUTER CIRCUITS; DEFECT DENSITY; DEFECTS; LIGHT EMITTING DIODES; MOLECULAR ELECTRONICS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICES; SILICON; SILICON WAFERS; SINGLE CRYSTALS; THIN FILM CIRCUITS; THIN FILMS;

COMPUTER MODELING; CURRENT DRIVERS; FIELD DEPENDENCE; FILM STRUCTURE; MICROCRYSTALLINE SILICON THIN FILMS; SINGLE CRYSTAL SILICON; TIME OF FLIGHT; TRANSPORT MECHANISM;

MICROCRYSTALLINE SILICON;

EID: 79952406814     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/253/1/012002     Document Type: Conference Paper

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47. th International Conference of the Balkan Physical Union vol 1203 p 1336