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Journal of Physics Condensed Matter

Volumn 14, Issue 28, 2002, Pages 6909-6915

Depth profiling in amorphous and microcrystalline silicon by transient photoconductivity techniques

(3) Bruggemann R a Main, C b Reynolds, S b

a UNIVERSITY OF OLDENBURG (Germany)

b UNIVERSITY OF ABERTAY DUNDEE (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FOURIER TRANSFORMS; HYDROGENATION; PHOTOCONDUCTIVITY; PHOTOCURRENTS; SEMICONDUCTING SILICON; SURFACE PROPERTIES;

TRANSIENT PHOTOCONDUCTIVITY (TPC);

AMORPHOUS SILICON;

EID: 0037158178 PISSN: 09538984 EISSN: None Source Type: Journal
DOI: 10.1088/0953-8984/14/28/302 Document Type: Article

Times cited : (5)

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