Investigation of the transport properties of microcrystalline silicon by time-of-flight (TOF)

Journal of Materials Science: Materials in Electronics

Volumn 14, Issue 10-12, 2003, Pages 733-734

  Serin, M ^a   Harder, N ^b   Carius, R ^b  

^a YILDIZ TECHNICAL UNIVERSITY   (Turkey)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRONS; SOLAR CELLS;

CURRENT TRANSIENTS;

SILICON;

EID: 0242317286     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1026151725719     Document Type: Conference Paper

References (5)

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2. T. TIEDJE in "Semiconductors and Semimetals", Vol. 21, Part C, edited by J. I. Pankove (Academic Press, New York, 1984).
3. J. M. MARSHALL, H. MICHIEL and G. J. ADRIAENSSENS, Philos. Mag. B 47 (1983) 211
4. G. JUSKA, K. ARLAUSKAS, N. NEKRASAS, J. STUCHLIK, X. NIQUILLE and N. WYRSCH, J. Non-Cryst. Solids 299-302 (2002) 375
5. J. M. MARSHALL, R. A. STREET and M. J. THOMPSON, Philos. Mag. B 54 (1986) 51