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Volumn 207, Issue 3, 2010, Pages 501-509

Amorphous silicon: Vehicle and test bed for large-area electronics

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC MATERIALS; LARGE-AREA ELECTRONICS; THIN FILM SILICON;

EID: 77950981619     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200982910     Document Type: Article
Times cited : (20)

References (38)
  • 5
    • 77950974217 scopus 로고
    • U.S. Patent 4,064,521, initial application of July 28
    • D. E. Carlson, U.S. Patent 4,064,521, initial application of July 28 (1975).
    • (1975)
    • Carlson, D.E.1
  • 8
    • 77951000034 scopus 로고    scopus 로고
    • August, issue
    • Phys. Today, August 2009 issue.
    • (2009) Phys. Today
  • 12
    • 84857630047 scopus 로고    scopus 로고
    • http://store.apple.com/us/product/M9179LL/A.
  • 13
    • 84857630478 scopus 로고    scopus 로고
    • http://www.uni-solar.com/uploadedFiles/PVL-144EN%28AA5-3636-03%29.pdf.
  • 14
    • 84857630048 scopus 로고    scopus 로고
    • http://www.inventux.com/en/x-series-micromorph/.
  • 15
    • 77950992915 scopus 로고    scopus 로고
    • Berlin, Germany, 21 April
    • J. Meier, IWTFSSC-2, Berlin, Germany, 21 April 2009.
    • (2009) IWTFSSC-2
    • Meier, J.1
  • 16
    • 77950995958 scopus 로고    scopus 로고
    • Berlin, Germany, 21 April
    • S. Wieder, IWTFSSC-2, Berlin, Germany, 21 April 2009.
    • (2009) IWTFSSC-2
    • Wieder, S.1
  • 33
    • 77950971401 scopus 로고    scopus 로고
    • Berlin, Germany, 21 April
    • A. Terakawa, IWTFSSC-2, Berlin, Germany, 21 April 2009.
    • (2009) IWTFSSC-2
    • Terakawa, A.1
  • 34
    • 77951011436 scopus 로고    scopus 로고
    • Electron Device Meeting, San Francisco, CA, USA, (IEEE, New York, NY, 2008), paper 4.5
    • B. Hekmatshoar, K. H. Cherenack, S. Wagner, and J. C. Sturm, in: Tech. Digest Internat. Electron Device Meeting, San Francisco, CA, USA, 2008 (IEEE, New York, NY, 2008), paper 4.5.
    • (2008) Tech. Digest Internat
    • Hekmatshoar, B.1    Cherenack, K.H.2    Wagner, S.3    Sturm, J.C.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.