Notch insensitive fracture in nanoscale thin films

Applied Physics Letters

Volumn 94, Issue 25, 2009, Pages

  Kumar, S ^a   Haque, M A ^a   Gao, H ^b  

^a The Pennsylvania State University   (United States)

^b Brown University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IN-SITU ELECTRON MICROSCOPY; NANO SCALE; NANOSCALE THIN FILMS; RUPTURE STRESS; SINGLE EDGE NOTCHED; TRANSMISSION ELECTRON MICROSCOPE;

FRACTURE; FRACTURE MECHANICS; STRENGTH OF MATERIALS; STRESS CONCENTRATION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 67649460716     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3157276     Document Type: Article

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