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Volumn 86, Issue 1, 2005, Pages

A microelectromechanical load sensor for in situ electron and x-ray microscopy tensile testing of nanostructures

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CARBON NANOTUBES; ELECTRIC POTENTIAL; INTEGRATED CIRCUITS; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SENSORS; TENSILE TESTING; TRANSMISSION ELECTRON MICROSCOPY; X RAY MICROSCOPES;

EID: 13544265414     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1844594     Document Type: Article
Times cited : (126)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.