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Volumn 86, Issue 1, 2005, Pages
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A microelectromechanical load sensor for in situ electron and x-ray microscopy tensile testing of nanostructures
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE;
CARBON NANOTUBES;
ELECTRIC POTENTIAL;
INTEGRATED CIRCUITS;
PERMITTIVITY;
SCANNING ELECTRON MICROSCOPY;
SENSORS;
TENSILE TESTING;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY MICROSCOPES;
LOAD SENSORS;
NANOWIRES;
RESONATING VOLTAGE;
SENSOR DISPLACEMENT;
MICROELECTROMECHANICAL DEVICES;
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EID: 13544265414
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1844594 Document Type: Article |
Times cited : (126)
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References (17)
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