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Volumn 519, Issue 6, 2011, Pages 1780-1786

Orientation of B-C-N hybrid films deposited on Ni (111) and polycrystalline Ti substrates explored by X-ray absorption spectroscopy

(7) Mannan, Md Abdul a,b Baba, Yuji a Kida, Tetsuya b Nagano, Masamitsu b Shimoyama, Iwao a Hirao, Norie a Noguchi, Hideyuki b

a JAPAN ATOMIC ENERGY AGENCY (Japan)

b SAGA UNIVERSITY (Japan)

Author keywords

Chemical vapor deposition; Crystalline h BCN; Near edge X ray absorption fine structure; Synchrotron radiation; Thin films; X ray photoelectron spectroscopy

Indexed keywords

B ATOMS; BORON CARBO-NITRIDE; CRYSTALLINE H-BCN; CRYSTALLINE PHASE; HYBRID FILM; HYBRID ORBITALS; LATTICE PLANE; LOCAL STRUCTURE; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURES; POLARIZATION DEPENDENCE; POLYCRYSTALLINE; RADIO FREQUENCY PLASMA ENHANCED CHEMICAL VAPOR DEPOSITIONS; RADIO-FREQUENCY POWER; RAMAN SPECTRA; RESONANCE PEAK; SINGLE-SOURCE MOLECULAR PRECURSORS; TI SUBSTRATES; WORKING PRESSURES; X RAY PHOTOELECTRON SPECTRA; XRD;

ABSORPTION; ATOMIC SPECTROSCOPY; ATOMS; BORON; BORON COMPOUNDS; CARBON NITRIDE; CRYSTALLINE MATERIALS; DEPOSITION; ELECTRONS; PHOTOELECTRICITY; PHOTONS; PLASMA DEPOSITION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; RAMAN SPECTROSCOPY; SUBSTRATES; SYNCHROTRON RADIATION; SYNCHROTRONS; THIN FILMS; VAPOR DEPOSITION; X RAY ABSORPTION; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

ABSORPTION SPECTROSCOPY;

EID: 78651257737 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2010.09.052 Document Type: Article

Times cited : (20)

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