Soft microelectrode linear array for scanning electrochemical microscopy

Analytical Chemistry

Volumn 82, Issue 24, 2010, Pages 10037-10044

  Cortés Salazar, Fernando ^a   Momotenko, Dmitry ^a   Lesch, Andreas ^b   Wittstock, Gunther ^b   Girault, Hubert H ^a  

^a EPFL   (Switzerland)

^b UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPROACH CURVE; BENDING DIRECTIONS; CARBON INK; CYCLIC VOLTAMMOGRAMS; DIFFUSION LAYERS; ELECTRODE SURFACES; FINITE ELEMENT METHOD SIMULATION; GOLD ON GLASS; HIGH RESOLUTION; HIGH-THROUGHPUT SCANNING; LINEAR ARRAYS; MICROELECTRODE ARRAY; PARYLENE COATINGS; SAMPLE SURFACE; SCANNING ELECTROCHEMICAL MICROSCOPY; SECM IMAGES; SURFACE ACTIVITIES; TOPOGRAPHIC EFFECTS; WORKING DISTANCES;

ARRAY PROCESSING; COATINGS; ELECTROCHEMICAL PROPERTIES; FINITE ELEMENT METHOD; MICROELECTRODES; POLYETHYLENE TEREPHTHALATES; PROBES; SCANNING; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SURFACE DEFECTS; THERMOPLASTICS; THROUGHPUT;

ANALYTIC EQUIPMENT;

ARTICLE; ELECTROCHEMICAL ANALYSIS; EQUIPMENT DESIGN; FINITE ELEMENT ANALYSIS; HIGH THROUGHPUT SCREENING; INSTRUMENTATION; METHODOLOGY; MICROELECTRODE; MICROSCOPY; SURFACE PROPERTY;

ELECTROCHEMICAL TECHNIQUES; EQUIPMENT DESIGN; FINITE ELEMENT ANALYSIS; HIGH-THROUGHPUT SCREENING ASSAYS; MICROELECTRODES; MICROSCOPY; SURFACE PROPERTIES;

EID: 78650332437     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac1019304     Document Type: Article

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