Numerical simulation of scanning electrochemical microscopy experiments with frame-shaped integrated atomic force microscopy-SECM probes using the boundary element method

Analytical Chemistry

Volumn 77, Issue 3, 2005, Pages 764-771

  Sklyar, Oleg ^a   Kueng, Angelika ^b   Kranz, Christine ^b   Mizaikoff, Boris ^b   Lugstein, Alois ^c   Bertagnolli, Emmerich ^c   Wittstock, Gunther ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^c VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY ELEMENT METHOD; COMPUTER SIMULATION; IMAGING TECHNIQUES; MICROELECTRODES; NUMERICAL ANALYSIS; SUBSTRATES;

AFM-SECM MEASUREMENTS; SCANNING ELECTROCHEMICAL MICROSCOPY; SECM IMAGES; SUBMICROELECTRODES;

ELECTROCHEMISTRY;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTROCHEMICAL ANALYSIS; IMAGE ANALYSIS; IMAGE QUALITY; METHODOLOGY; MICROELECTRODE; MOLECULAR PROBE; SCANNING ELECTROCHEMICAL MICROSCOPY; SIMULATION;

ELECTROCHEMISTRY; MATHEMATICS; MICROELECTRODES; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, SCANNING PROBE; POTENTIOMETRY; TOPOGRAPHY, MEDICAL;

EID: 13244269947     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac048732n     Document Type: Article

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