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Volumn 102, Issue 49, 1998, Pages 9946-9951
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Scanning Electrochemical Microscopy (SECM): An investigation of the effects of tip geometry on amperometric tip response
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000317954
PISSN: 15206106
EISSN: None
Source Type: Journal
DOI: 10.1021/jp982829u Document Type: Article |
Times cited : (227)
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References (33)
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