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Volumn 367, Issue 4, 2000, Pages 346-351

Investigation of ion-bombarded conducting polymer films by scanning electrochemical microscopy (SECM)

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001416015     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160000389     Document Type: Article
Times cited : (59)

References (36)
  • 36
    • 25144450327 scopus 로고    scopus 로고
    • Research Systems Inc., Boulder
    • Research Systems (1999) Using IDL 5.1, Research Systems Inc., Boulder, pp 241-242, ftp://ftp.rsinc.com/
    • (1999) Using IDL 5.1 , pp. 241-242
    • Systems, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.