Scanning electrochemical microscopy with simultaneous independent topography

Journal of the Electrochemical Society

Volumn 145, Issue 4, 1998, Pages

  James, P I ^a   Garfias Mesias, L F ^a,c   Moyer, P J ^b   Smyrl, W H ^a,c  

^a University of Minnesota   (United States)

^b UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE   (United States)

^c ELECTROCHEMICAL SOCIETY

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTROCHEMISTRY; MICROELECTRODES; PROBES;

SCANNING ELECTROCHEMICAL MICROSCOPY (SECM); SHEAR FORCE FEEDBACK;

IMAGING TECHNIQUES;

EID: 0032050216     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1838417     Document Type: Article

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