Determination of the Ge-nanocrystal/SiO2 matrix interface trap density from the small signal response of charge stored in the nanocrystals

Physical Review B - Condensed Matter and Materials Physics

Volumn 82, Issue 19, 2010, Pages

  Peibst, R ^a   De Sousa, J S ^b   Hofmann, K R ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^b FEDERAL UNIVERSITY OF CEARÁ   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 78649758298     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.195415     Document Type: Article

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