메뉴 건너뛰기




Volumn 27, Issue 4, 2006, Pages 252-254

Electroluminescence from the Ge quantum dot MOS tunneling diodes

Author keywords

Ge quantum dot (QD) light emitting diodes (LEDs); MOS tunneling diode

Indexed keywords

DEPOSITION; ELECTROLUMINESCENCE; ELECTRON TUNNELING; ELECTRONS; LIGHT EMITTING DIODES; OXIDES; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR QUANTUM DOTS; ULTRATHIN FILMS;

EID: 33645647504     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2006.870416     Document Type: Article
Times cited : (30)

References (13)
  • 1
    • 0000720022 scopus 로고    scopus 로고
    • "Room-temperature electroluminescence from electron-hole plasmas in the metal oxide silicon tunneling diodes"
    • Mar
    • C. W. Liu, M. H. Lee, M.-J. Chen, I. C. Lin, and C.-F. Lin, "Room-temperature electroluminescence from electron-hole plasmas in the metal oxide silicon tunneling diodes," Appl. Phys. Lett., vol. 76, no. 12, pp. 1516-1518, Mar. 2000.
    • (2000) Appl. Phys. Lett. , vol.76 , Issue.12 , pp. 1516-1518
    • Liu, C.W.1    Lee, M.H.2    Chen, M.-J.3    Lin, I.C.4    Lin, C.-F.5
  • 3
    • 0036923551 scopus 로고    scopus 로고
    • "High efficient 820 nm MOS Ge quantum dot photodetectors for short-reach integrated optical receivers with 1300 and 1500 nm sensitivity"
    • San Francisco, CA
    • B.-C. Hsu, S. T. Chang, C.-R. Shie, C.-C. Lai, P. S. Chen, and C. W. Liu, "High efficient 820 nm MOS Ge quantum dot photodetectors for short-reach integrated optical receivers with 1300 and 1500 nm sensitivity," in IEDM Tech. Dig., San Francisco, CA, 2002, pp. 91-94.
    • (2002) IEDM Tech. Dig. , pp. 91-94
    • Hsu, B.-C.1    Chang, S.T.2    Shie, C.-R.3    Lai, C.-C.4    Chen, P.S.5    Liu, C.W.6
  • 4
    • 20444477540 scopus 로고    scopus 로고
    • "The evolution of electroluminescence in Ge quantum-dot diodes with the fold number"
    • Dec
    • Y. H. Peng, C.-H. Hsu, C. H. Kuan, C. W. Liu, P.S. Chen, M.-J. Tsai, and Y. W. Suen, "The evolution of electroluminescence in Ge quantum-dot diodes with the fold number," Appl. Phys. Lett., vol. 85, no. 25, pp. 6107-6109, Dec. 2004.
    • (2004) Appl. Phys. Lett. , vol.85 , Issue.25 , pp. 6107-6109
    • Peng, Y.H.1    Hsu, C.-H.2    Kuan, C.H.3    Liu, C.W.4    Chen, P.S.5    Tsai, M.-J.6    Suen, Y.W.7
  • 5
    • 0000928605 scopus 로고    scopus 로고
    • "Positioning of self-assembled, single-crystal, germanium islands by silicon nanoimprinting"
    • Mar
    • T. I. Kamins, D. A. A. Ohlberg, R. S. Williams, W. Zhang, and S. Y. Chou, "Positioning of self-assembled, single-crystal, germanium islands by silicon nanoimprinting," Appl. Phys. Lett., vol. 74, no. 12, pp. 1773-1775, Mar. 1999.
    • (1999) Appl. Phys. Lett. , vol.74 , Issue.12 , pp. 1773-1775
    • Kamins, T.I.1    Ohlberg, D.A.A.2    Williams, R.S.3    Zhang, W.4    Chou, S.Y.5
  • 6
    • 36448998842 scopus 로고
    • "Photoluminescence and electroluminescence of SiGe dots fabricated by island growth"
    • Jan
    • R. Apetz, L. Vescan, A. Hartman, C. Dieker, and H. Luth, "Photoluminescence and electroluminescence of SiGe dots fabricated by island growth," Appl. Phys. Lett., vol. 66, no. 4, pp. 445-447, Jan. 1995.
    • (1995) Appl. Phys. Lett. , vol.66 , Issue.4 , pp. 445-447
    • Apetz, R.1    Vescan, L.2    Hartman, A.3    Dieker, C.4    Luth, H.5
  • 7
    • 0000720021 scopus 로고    scopus 로고
    • "Temperature dependence of the electron-hole-plasma electroluminescence from metal-oxide-silicon tunneling diodes"
    • Aug
    • C. W. Liu, M.-J. Chen, I. C. Lin, M. H. Lee, and C.-F. Lin, "Temperature dependence of the electron-hole-plasma electroluminescence from metal-oxide-silicon tunneling diodes," Appl. Phys. Lett., vol. 77, no. 8, pp. 1111-1113, Aug. 2000.
    • (2000) Appl. Phys. Lett. , vol.77 , Issue.8 , pp. 1111-1113
    • Liu, C.W.1    Chen, M.-J.2    Lin, I.C.3    Lee, M.H.4    Lin, C.-F.5
  • 8
    • 0034504101 scopus 로고    scopus 로고
    • "Roughness-enhanced electroluminescence from metal oxide silicon tunneling diodes"
    • Dec
    • C. W. Liu, M. H. Lee, M.-J. Chen, C.-F. Lin, and M. Y. Chern, "Roughness-enhanced electroluminescence from metal oxide silicon tunneling diodes," IEEE Electron Device Lett., vol. 21, no. 12, pp. 601-603, Dec. 2000.
    • (2000) IEEE Electron Device Lett. , vol.21 , Issue.12 , pp. 601-603
    • Liu, C.W.1    Lee, M.H.2    Chen, M.-J.3    Lin, C.-F.4    Chern, M.Y.5
  • 9
    • 0032614781 scopus 로고    scopus 로고
    • "Raman scattering from a self-organized Ge dot superlattice"
    • Mar
    • J. L. Liu, Y. S. Tang, K. L. Wang, T. Radetic, and R. Gronsky, "Raman scattering from a self-organized Ge dot superlattice," Appl. Phys. Lett., vol. 74, no 13, pp. 1863-1865, Mar. 1999.
    • (1999) Appl. Phys. Lett. , vol.74 , Issue.13 , pp. 1863-1865
    • Liu, J.L.1    Tang, Y.S.2    Wang, K.L.3    Radetic, T.4    Gronsky, R.5
  • 10
    • 0015587099 scopus 로고
    • "Raman scattering in Ge-Si alloys"
    • Feb
    • W. J. Brya, "Raman scattering in Ge-Si alloys," Solid State Commun., vol. 12, no. 4, pp. 253-257, Feb. 1973.
    • (1973) Solid State Commun. , vol.12 , Issue.4 , pp. 253-257
    • Brya, W.J.1
  • 12
    • 0001403103 scopus 로고    scopus 로고
    • "Infrared and photoluminescence spectroscopy of p-doped self-assembled Ge dots on Si"
    • Oct
    • L. P. Rokhinson, D. C. Tsui, J. L. Benton, and Y.-H. Xie, "Infrared and photoluminescence spectroscopy of p-doped self-assembled Ge dots on Si," Appl. Phys. Lett., vol. 75, no. 16, pp. 2413-2415, Oct. 1999.
    • (1999) Appl. Phys. Lett. , vol.75 , Issue.16 , pp. 2413-2415
    • Rokhinson, L.P.1    Tsui, D.C.2    Benton, J.L.3    Xie, Y.-H.4
  • 13
    • 0034262481 scopus 로고    scopus 로고
    • "Preparation and optical properties of Ge and C-induced Ge quantum dots on Si"
    • Sep
    • K. Eberl, O. G. Schmidt, O. Kienzle, and F. Ernst, "Preparation and optical properties of Ge and C-induced Ge quantum dots on Si," Thin Solid Films, vol. 373, no. 1-2, pp. 164-169, Sep. 2000.
    • (2000) Thin Solid Films , vol.373 , Issue.1-2 , pp. 164-169
    • Eberl, K.1    Schmidt, O.G.2    Kienzle, O.3    Ernst, F.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.