Low-energy cathodoluminescence microscopy for the characterization of nanostructures

Science and Technology of Advanced Materials

Volumn 11, Issue 4, 2010, Pages

  Dierre, Benjamin ^a,b   Yuan, Xiaoli ^a   Sekiguchi, Takashi ^a,b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

Author keywords

Cathodoluminescence; Electron beam; Nanostructures; Phosphors; Rare earth; Wide band gap semiconductors

Indexed keywords

EID: 78149340390     PISSN: 14686996     EISSN: None     Source Type: Journal    
DOI: 10.1088/1468-6996/11/4/043001     Document Type: Review

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