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Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics

Volumn 27, Issue 3, 2009, Pages 1710-1716

Polarity-related asymetry at ZnO surfaces and metal interfaces

(6) Dong, Yufeng a Fang, Z Q b Look, D C b Doutt, D R c Hetzer, M J c Brillson, L J c

a Ohio State University (United States)

b WRIGHT STATE UNIVERSITY (United States)

c OHIO STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP LEVEL TRANSIENT SPECTROSCOPY; DEFECTS; DIODES; ELECTRON BEAMS; GOLD COATINGS; METALS; POWER QUALITY; SCHOTTKY BARRIER DIODES; TRANSPORT PROPERTIES; ZINC; ZINC OXIDE;

CAPACITANCE VOLTAGE MEASUREMENTS; CATHODOLUMINESCENCE SPECTROSCOPY; COMPREHENSIVE MODEL; CURRENT VOLTAGE; DEFECT EMISSION; DEPTH-RESOLVED; EMISSION QUALITY; INTERFACE CHEMISTRY; LOW ENERGY ELECTRON BEAM IRRADIATION; METAL INTERFACE; NEAR BAND EDGE EMISSIONS; NEAR-SURFACE DEFECTS; POLAR SURFACES; POLARITY DEPENDENCE; REMOTE PLASMAS; SCHOTTKY BARRIERS; ZNO; ZNO SURFACE;

PALLADIUM;

EID: 74349121695 PISSN: 21662746 EISSN: 21662754 Source Type: Journal
DOI: 10.1116/1.3119681 Document Type: Conference Paper

Times cited : (15)

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