Nanoscale depth-resolved cathodoluminescence spectroscopy of ZnO surfaces and metal interfaces

Superlattices and Microstructures

Volumn 45, Issue 4-5, 2009, Pages 206-213

  Brillson, L J ^a,b   Mosbacker, H L ^b   Doutt, D L ^b   Dong, Y ^b   Fang, Z Q ^c,d   Look, D C ^c,d   Cantwell, G ^e   Zhang, J ^e   Song, J J ^e  

^a The Ohio State University   (United States)

^b OHIO STATE UNIVERSITY   (United States)

^c WRIGHT STATE UNIVERSITY   (United States)

^d AIR FORCE RESEARCH LABORATORY   (United States)

^e ZN Technology Inc   (United States)

Author keywords

Atomic force microscopy; Cathodoluminescence spectroscopy; Defects; Interface; Kelvin probe force microscopy; Scanning electron microscope; Surface; ZnO

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ATOMS; CATHODOLUMINESCENCE; CHEMICAL BONDS; ELECTRON MICROSCOPES; ELECTRONIC PROPERTIES; LIGHT EMISSION; NANOSTRUCTURED MATERIALS; POINT DEFECTS; PROBES; SCANNING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ZINC COMPOUNDS; VACUUM; ZINC OXIDE;

CATHODOLUMINESCENCE SPECTROSCOPY; INTERFACE; KELVIN PROBE FORCE MICROSCOPY; SCANNING ELECTRON MICROSCOPE; ZNO;

SURFACE DEFECTS;

EID: 62949137780     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2008.11.008     Document Type: Article

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