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Volumn 59, Issue 1, 2011, Pages 191-201

Edge and finite size effects in polycrystalline ferroelectrics

Author keywords

Ferroelectricity; Modeling; Residual stresses; Thin films

Indexed keywords

CRYSTALLOGRAPHIC ORIENTATIONS; DEPOSITED FILMS; EFFECTIVE STRESS; EPITAXIAL STRAIN; FINITE SIZE EFFECT; GEOMETRICAL PARAMETERS; IN-PLANE STRESS; MODELING; OUT-OF-PLANE; POLARIZATION HYSTERESIS; POLARIZATION SWITCHING; POLYCRYSTALLINE; POLYCRYSTALLINE FERROELECTRICS; POLYCRYSTALLINE FILM; POLYCRYSTALLINE STRUCTURE; PZT; REMNANT POLARIZATIONS; SINGLE-CRYSTAL PROPERTIES; STRONG CORRELATION;

EID: 78049527756     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.09.024     Document Type: Article
Times cited : (6)

References (62)
  • 3
    • 33847206105 scopus 로고    scopus 로고
    • Applications of modern ferroelectrics
    • J.F. Scott Applications of modern ferroelectrics Science 315 2007 954 959
    • (2007) Science , vol.315 , pp. 954-959
    • Scott, J.F.1
  • 15
    • 0035307597 scopus 로고    scopus 로고
    • E. Suhir J Appl Phys 89 7 2001 3685 3694
    • (2001) J Appl Phys , vol.89 , Issue.7 , pp. 3685-3694
    • Suhir, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.