Microscopic model of ferroelectricity in stress-free PbTiO3 ultrathin films

Applied Physics Letters

Volumn 76, Issue 19, 2000, Pages 2767-2769

  Ghosez, Ph ^a,b   Rabe, K M ^a  

^a Yale University   (United States)

^b UNIVERSITY OF LIÈGE   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001540677     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126469     Document Type: Article

References (22)

1. M. E. Lines and A. M. Glass, Principles and Applications of Ferroelectrics and Related Materials (Clarendon, Oxford, 1977).
2. J. F. Scott, Ferroelectr. Rev. 1, 1 (1998).
3. K. Ishikawa, T. Nomura, N. Okada, and K. Takada, Jpn. J. Appl. Phys., Part 1 35, 5196 (1996).
4. S. Li, J. A. Eastman, J. M. Vetrone, C. M. Foster, R. E. Newnham, and L. E. Cross, Jpn. J. Appl. Phys., Part 1 36, 5169 (1997).
5. T. Maruyama, M. Saitoh, I. Sakay, and T. Hidaka, Appl. Phys. Lett. 73, 3524 (1998).
6. T. Tybell, C. Ahn, and J.-M. Triscone, Appl. Phys. Lett. 75, 856 (1999).
7. U. V. Waghmare and K. M. Rabe, Phys. Rev. B 55, 6161 (1997).
8. K. M. Rabe and U. V. Waghmare, Phys. Rev. B 52, 13236 (1995).
9. K. M. Rabe and Ph. Ghosez, J. Electroceram. (in press).
10. R. E. Cohen, Ferroelectrics 194, 323 (1997).
11. J. Padilla and D. Vanderbilt, Phys. Rev. B 56, 1625 (1997); Surf. Sci. 418, 64 (1998); B. Mayer, J. Padilla, and D. Vanderbilt, Faraday Discuss. 114, 395 (1999).
12. J. Padilla and D. Vanderbilt, Phys. Rev. B 56, 1625 (1997); Surf. Sci. 418, 64 (1998); B. Mayer, J. Padilla, and D. Vanderbilt, Faraday Discuss. 114, 395 (1999).
13. J. Padilla and D. Vanderbilt, Phys. Rev. B 56, 1625 (1997); Surf. Sci. 418, 64 (1998); B. Mayer, J. Padilla, and D. Vanderbilt, Faraday Discuss. 114, 395 (1999).
14. L. Fu, E. Yaschenko, L. Resca, and R. Resta, AIP Conf. Proc. 436, 107 (1998).
15. Ph. Ghosez, E. Cockayne, U. V. Waghmare, and K. M. Rabe, Phys. Rev. B 60, 836 (1999).
16. A. Ruini, R. Resta, and S. Baroni, Phys. Rev. B 57, 5742 (1998).
17. Ph. Ghosez and K. M. Rabe (unpublished).
18. For a fully quantitative assessment of the effects of electrical boundary conditions, it is necessary to move the plates at the level of the interionic Hamiltonian, before the projection. This would also lead to slight modifications of the short-range surface parameters.
19. N. A. Pertsev, A. G. Zembilgotov, and A. K. Tagantsev, Phys. Rev. Lett. 80, 1988 (1998).
20. K. Binder, Ferroelectrics 35, 99 (1981); R. Kretschmer and K. Binder, Phys. Rev. B 20, 1065 (1979).
21. K. Binder, Ferroelectrics 35, 99 (1981); R. Kretschmer and K. Binder, Phys. Rev. B 20, 1065 (1979).
22. Y. Watanabe, Phys. Rev. B 57, 789 (1998).